Electronic components testing

During the development of the EPT, the CSR has performed radiation hardness tests i.e. Total Ionising Dose (TID) and Single Event Effect (SEE), on some key components that are part of the sensor signal chain (charge sensitive amplifier and ADC driver): The operational amplifier AD8011, the Junction Field Effect Transistor PMBFJ310, the differential amplifier THS4521.

Within the AHM project (Active Hydrogen Maser for space), financed by the "Région Wallonne", UCLouvain/ICTEAM and CSR team are in charge of the radiation hardness testing of RF LDMOS power transistors. The complete consortium includes two universities i.e. Université de Liège (ULg-IPNAS, ULg-CSL) and Université Catholique de Louvain (UCLouvain/ICTEAM, UCLouvain/ELI/CSR) and two private companies i.e. Gillam SA and Polmans SA.